640×512 350fps 400–1700nm USB3.0 SWIRカメラ | Sony IMX991, TEC/外部冷却 iBX-SWU991A/J

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Q: What is the spectral range of the iBX-SWU991A/J SWIR camera?
A: The iBX-SWU991A/J SWIR camera offers a wide spectral response from 400nm to 1700nm, enabling imaging in both the visible and short-wave infrared (SWIR) spectrum. This makes it suitable for applications such as semiconductor inspection, spectroscopy, material analysis, and machine vision.

Q: Which sensor is used in this SWIR camera?
A: This camera is equipped with the Sony IMX991 InGaAs sensor, a high-performance SWIR image sensor known for its high sensitivity, low noise, and excellent image quality. The sensor features a 640 × 512 resolution, 5μm pixel size, and supports frame rates up to 350fps.

Q: Can this SWIR camera see through silicon?
A: Yes. Thanks to its 400–1700nm SWIR sensitivity, the camera can image through silicon materials that are opaque to visible-light cameras. This capability makes it ideal for wafer inspection, semiconductor packaging analysis, and failure detection in electronic components.

Q: What industries and applications is this camera designed for?
A: The iBX-SWU991A/J is widely used in semiconductor inspection, industrial machine vision, scientific research, spectroscopy, solar cell inspection, laser beam analysis, defense imaging, and quality control applications where SWIR imaging provides advantages over conventional cameras.

Q: What cooling options are available?
A: The camera is available with either TEC (Thermoelectric) Cooling or an External Cooling System. Both options help reduce sensor noise and improve image stability, especially during long-exposure imaging or continuous operation in demanding environments.

Q: Does the camera support industrial system integration?
A: Yes. The iBX-SWU991A/J features a USB3.0 interface for high-speed data transfer and seamless integration into machine vision systems, laboratory setups, OEM platforms, and automated inspection equipment.