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Vision Datum  |  SKU: VT-LEM10021SWIR-H2

100mm 200mm Manual Telephoto SWIR Lens

Regular price $2,090.00
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FAQ

Q1: What wavelength range does this lens support?
A: It supports 400–1700nm SWIR imaging, covering visible extended infrared to shortwave infrared applications.

Q2: What sensor size is compatible?
A: The lens is designed for 1-inch (25.6mm) SWIR sensors, commonly used in industrial and scientific cameras.

Q3: What focal lengths are available?
A: The series includes 100mm, 200mm, 300mm, and 400mm telephoto options for flexible magnification.

Q4: Is this a fixed or zoom lens?
A: It is a manual focus fixed focal length lens, with adjustable aperture for imaging optimization.

Q5: What interfaces does it support?
A: It supports C-Mount and M42 mounts, making it compatible with most SWIR machine vision systems.

Q6: What industries use this lens?
A: It is widely used in semiconductor inspection, material analysis, remote sensing, and industrial machine vision.

Product Description 

The SWIR Telephoto Lens Series (100–400mm) is designed for high-performance imaging in the 400–1700nm shortwave infrared range. It supports 1-inch sensors and delivers stable, high-contrast imaging for long-distance and precision inspection tasks.

With multiple focal length options (100mm, 200mm, 300mm, 400mm), the lens provides flexible magnification for industrial and scientific applications. Its manual focus and adjustable aperture design allow precise optical tuning for different working distances and environments.

Compatible with C-Mount and M42 interfaces, this lens is widely used in SWIR machine vision systems for semiconductor inspection, material analysis, and remote sensing.

Key Features

  • SWIR range: 400–1700nm
  • Supports 1" sensor format
  • Focal lengths: 100 / 200 / 300 / 400mm
  • Manual focus with adjustable aperture
  • C-Mount / M42 compatible
  • Long-distance imaging capability
  • High-contrast SWIR imaging
  • Industrial-grade optical design

Main Applications

  • Semiconductor inspection
  • Material and wafer analysis
  • Industrial defect detection
  • Long-range SWIR imaging
  • Scientific research
  • Remote sensing systems
  • Aerospace inspection

Specifications

Model EFL
F#
Wavelength
VT-LEM10021SWIR-H2
100mm
F2.1
800-1700nm
VT-LEM20040SWIR-H1
200mm
F4-22
900-1700nm
VT-LEM30040SWIR-H1
300mm
F4-22
400-1700nm
VT-LEM40056SWIR-H1
400mm
F5.6
900-1700nm

 

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