SWIR Line Scan Camera

SWIR Line Scan Cameras are designed for high-speed continuous inspection across the 900–1700nm range. Available in 512-pixel to 2K configurations with pixel sizes from 10μm, they provide reliable spectral imaging for production-line applications.

GigE, Camera Link, and CoaXPress interfaces support flexible integration into high-speed machine vision systems for web inspection, semiconductor inspection, sorting, and surface defect detection.