LEO 25MG-5gm-NIR 25MP GMAX0505 4.5FPS GigE NIR Camera

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Q1: What is the resolution and sensor used in the LEO 25MG-5GM-NIR camera?
A: The LEO 25MG-5GM-NIR features a 25MP Gpixel GMAX0505 CMOS sensor with 5120 × 5120 resolution, providing high-detail imaging for demanding near-infrared applications.

Q2: What are the advantages of using an NIR camera compared with a visible light camera?
A: NIR imaging can reveal material characteristics and defects that are difficult or impossible to detect under visible light. It is widely used for material analysis, semiconductor inspection, solar cell inspection, and industrial quality control.

Q3: Is the LEO 25MG-5GM-NIR suitable for industrial inspection systems?
A: Yes. With high-resolution imaging, excellent low-light sensitivity, and a GigE interface, the camera is designed for integration into automated inspection systems, machine vision platforms, and scientific imaging setups.

Q4: What interface does the camera use?
A: The LEO 25MG-5GM-NIR uses a GigE interface, providing stable long-distance data transmission and flexible integration for industrial machine vision systems.

Q5: What applications are suitable for this 25MP NIR camera?
A: The camera is suitable for applications including:
•Near-infrared material inspection
•Semiconductor and electronics inspection
•Solar cell analysis
•Battery material inspection
•Scientific imaging
•Industrial defect detection

Q6: Can this camera be used with NIR lenses?
A: Yes. The LEO 25MG-5GM-NIR is designed for NIR imaging systems and can be paired with compatible NIR or VIS-NIR corrected lenses to achieve optimal image quality in near-infrared wavelengths.