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Vision Datum  |  SKU: iBX-SWG990A

iBX-SWG990A/J GigE SWIR Camera | Sony IMX990, 1280×1024, 90fps, 400–1700nm

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FAQ

Q: What is the spectral range of the IMX990 sensor?
A: The Sony IMX990 sensor supports a spectral range of 400–1700nm, covering visible and short-wave infrared imaging.

Q: What is this SWIR camera used for?
A: It is used for semiconductor inspection, machine vision, scientific research, silicon imaging, and material analysis.

Q: Can SWIR cameras see through silicon?
A: Yes. SWIR light above ~1100nm can penetrate silicon, allowing internal defect and structure inspection.

Q: What is the benefit of TEC cooling?
A: TEC cooling reduces sensor noise and improves image stability during long exposure and continuous operation.

Q: What is the difference between USB3.0 and GigE SWIR cameras?
A: USB3.0 cameras offer higher speed and are ideal for local systems, while GigE cameras support longer distance and industrial network integration.

Q: What industries use IMX990 SWIR cameras?
A: They are widely used in semiconductor manufacturing, machine vision, electronics inspection, scientific research, and solar cell inspection.

Descrizione del prodotto

La fotocamera SWIR GigE iBX-SWG990A/J è un sistema di imaging a infrarossi a onde corte ad alte prestazioni basato sul sensore Sony IMX990 InGaAs. Offre una risoluzione di 1280 × 1024, un frame rate fino a 90fps e un ampio 400–1700nm intervallo di risposta spettrale, rendendola adatta per applicazioni di ispezione industriale, visione artificiale e imaging scientifico.

Progettata per l'automazione industriale e il deployment a livello di sistema, l'interfaccia GigE consente una trasmissione dati stabile su lunghe distanze, la sincronizzazione multi-fotocamera e un'integrazione senza interruzioni nelle reti di fabbrica.

La fotocamera supporta le opzioni di raffreddamento TEC e raffreddamento esterno, garantendo prestazioni di imaging a basso rumore e stabili in ambienti di funzionamento continuo.

Caratteristiche principali

  • Sensore SWIR InGaAs Sony IMX990
  • Risoluzione 1280 × 1024
  • Frame rate fino a 90fps
  • Intervallo spettrale 400–1700nm
  • Interfaccia GigE Vision
  • Opzioni di raffreddamento TEC / Esterno
  • Imaging a basso rumore e alta sensibilità

Applicazioni

  • Ispezione di wafer di semiconduttori
  • Imaging del silicio e analisi dei difetti
  • Sistemi di visione artificiale industriale
  • Automazione di fabbrica & QC inline
  • Spettroscopia e imaging scientifico
  • Ispezione di celle solari
  • Ispezione di elettronica e materiali

Specifiche

Modello
iBX-SWG990A/J
Sensore Sony IMX990
Tipo di sensore Sensore SWIR InGaAs
Risoluzione
1280 x 1024
Dimensione sensore
1/2"
Dimensione pixel 5μm × 5μm
Intervallo spettrale 400nm–1700nm
Frame rate 90fps
Interfaccia GigE
Modalità di raffreddamento Raffreddamento TEC / Raffreddamento esterno
Tipo di imaging SWIR (Infrarossi a onde corte)
Applicazione Industriale, Scientifico, Semiconduttori, Difesa

 

GigE vs USB3.0 Differenza

Rispetto alle fotocamere SWIR USB3.0, la versione GigE offre:

  • Maggiore distanza di trasmissione del cavo
  • Migliore idoneità per le reti industriali
  • Integrazione più semplice nei sistemi distribuiti
  • Sincronizzazione multi-fotocamera più stabile

I modelli USB3.0 si concentrano di più sull'acquisizione locale ad alta velocità, mentre i modelli GigE sono ottimizzati per il deployment su scala di fabbrica e l'integrazione di sistema.

Sony IMX991 SWIR camera inspecting semiconductor wafers for defect detection and quality control

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