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Vision Datum  |  SKU: iBX-SWU991N

iBX-SWU991N 640×512 SWIR Camera | 428fps USB 3.0

$8,280.00
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FAQ

Q1. What sensor does the iBX-SWU991N use?
The iBX-SWU991N features the Sony IMX991 InGaAs sensor with 640 × 512 resolution and 5μm pixels.
Q2. What is the frame rate of the iBX-SWU991N?
The camera offers a specified frame rate of up to 428.1fps, making it suitable for high-speed SWIR imaging and industrial inspection.
Q3. What is the spectral range of this SWIR camera?
The camera covers 400–1700nm, supporting visible, near-infrared, and short-wave infrared imaging.
Q4. What interface does the iBX-SWU991N support?
It uses a USB 3.0 interface for high-speed image data transmission to compatible host systems.
Q5. Can this camera inspect silicon wafers?
Yes. SWIR imaging can reveal selected internal and surface features in silicon materials. Inspection performance depends on wafer properties, illumination and optical configuration.
Q6. Is the camera suitable for food quality inspection?
Yes. The camera can support selected food inspection applications by capturing material and moisture-related contrast beyond conventional visible-light imaging.

Product Description

The iBX-SWU991N is a high-speed USB 3.0 SWIR industrial camera featuring the Sony IMX991 InGaAs sensor, 640 × 512 resolution, and up to 428.1fps. With a 400–1700nm spectral range, 5μm pixel size, and 1/4" sensor format, it supports visible-to-SWIR imaging for industrial inspection and scientific applications.

Equipped with a USB 3.0 interface and C-mount, the camera is suitable for machine vision integration, semiconductor inspection, material differentiation, food quality inspection, and high-speed SWIR imaging applications.

Key Features

  • Sony IMX991 InGaAs Sensor – Short-wave infrared imaging for industrial and scientific applications.
  • 640 × 512 Resolution – Approximately 0.33MP imaging resolution.
  • 428.1fps High-Speed Imaging – Fast image acquisition for dynamic inspection tasks.
  • 400–1700nm Spectral Range – Visible, near-infrared and SWIR imaging capabilities.
  • 5μm Pixel Size – Fine pixel pitch for compact SWIR imaging systems.
  • 1/4" Sensor Format – Compact sensor size for optical system integration.
  • USB 3.0 Interface – High-speed data connectivity for compatible host systems.
  • C-Mount Lens Interface – Compatible with appropriately selected VIS-SWIR industrial lenses.

Applications

  • Semiconductor & Silicon Wafer Inspection
  • Food Quality & Fruit Inspection
  • Material Sorting & Identification
  • Moisture & Water Content Inspection
  • Packaging Content Inspection
  • Solar Cell & Photovoltaic Inspection

Specifications

Model

iBX-SWU991N

Camera Type

SWIR Area Scan Camera

Sensor

Sony IMX991

Sensor Technology

InGaAs

Resolution

640 × 512

Effective Resolution

0.33MP

Frame Rate

428.1fps

Pixel Size

5μm × 5μm

Sensor Format

1/4"

Spectral Range

400–1700nm

Data Interface

USB 3.0

Lens Mount

C-Mount

 

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