TLSW-H1.1 SWIR Telecentric Lens Series | 950–1800nm for 1.1" InGaAs Sensors

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Q: What sensors are the TLSW Series lenses designed for?
A: The TLSW Series is optimized for 1.1" InGaAs sensors, including the Sony IMX990, providing high-performance SWIR imaging from 950–1800 nm.

Q: What spectral range do these lenses support?
A: The lenses are specially designed for 950–1800 nm SWIR transmission, enabling imaging beyond the visible spectrum.

Q: What magnification options are available?
A: The series offers 0.5×, 0.7×, 1×, 2×, and 4× magnifications to meet different field-of-view and precision measurement requirements.

Q: Are both coaxial and non-coaxial versions available?
A: Yes. The 1× and 2× models are available in both coaxial and non-coaxial configurations for flexible illumination setups.

Q: Can the depth of field be adjusted?
A: Yes. The 1× and 2× models feature adjustable iris control, allowing users to optimize depth of field for specific applications.

Q: What applications are these SWIR telecentric lenses suitable for?
A: They are ideal for semiconductor inspection, wafer analysis, solar cell inspection, precision metrology, material identification, and scientific imaging.

Q: Why use SWIR telecentric lenses instead of visible-light optics?
A: SWIR telecentric lenses can reveal material differences and defects invisible to visible-light systems, while maintaining low distortion and high measurement accuracy.