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Vision Datum  |  SKU: VT-LEM10021SW-H2-C

Lente SWIR Telefoto Manual 100mm 200mm

Precio normal $2,090.00
Los gastos de envío se calcularán al momento de pagar.
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相机镜头类型
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FAQ

Q1: What wavelength range does this lens support?
A: It supports 400–1700nm SWIR imaging, covering visible extended infrared to shortwave infrared applications.

Q2: What sensor size is compatible?
A: The lens is designed for 1-inch (25.6mm) SWIR sensors, commonly used in industrial and scientific cameras.

Q3: What focal lengths are available?
A: The series includes 100mm, 200mm, 300mm, and 400mm telephoto options for flexible magnification.

Q4: Is this a fixed or zoom lens?
A: It is a manual focus fixed focal length lens, with adjustable aperture for imaging optimization.

Q5: What interfaces does it support?
A: It supports C-Mount and M42 mounts, making it compatible with most SWIR machine vision systems.

Q6: What industries use this lens?
A: It is widely used in semiconductor inspection, material analysis, remote sensing, and industrial machine vision.

Descripción del producto 

La serie de lentes teleobjetivo SWIR (100–400mm) está diseñada para la imagen de alto rendimiento en el rango de infrarrojo de onda corta de 400–1700nm. Admite sensores de 1 pulgada y ofrece una imagen estable y de alto contraste para tareas de inspección a larga distancia y de precisión.

Con múltiples opciones de longitud focal (100mm, 200mm, 300mm, 400mm), la lente proporciona una magnificación flexible para aplicaciones industriales y científicas. Su enfoque manual y diseño de apertura ajustable permiten un ajuste óptico preciso para diferentes distancias de trabajo y entornos.

Compatible con interfaces C-Mount y M42, esta lente se utiliza ampliamente en sistemas de visión por máquina SWIR para la inspección de semiconductores, el análisis de materiales y la teledetección.

Características principales

  • Rango SWIR: 400–1700nm
  • Admite formato de sensor de 1"
  • Longitudes focales: 100 / 200 / 300 / 400mm
  • Enfoque manual con apertura ajustable
  • Compatible con C-Mount / M42
  • Capacidad de imagen a larga distancia
  • Imagen SWIR de alto contraste
  • Diseño óptico de grado industrial

Aplicaciones principales

  • Inspección de semiconductores
  • Análisis de materiales y obleas
  • Detección de defectos industriales
  • Imagen SWIR a larga distancia
  • Investigación científica
  • Sistemas de teledetección
  • Inspección aeroespacial

Especificaciones

Modelo EFL
F#
Longitud de onda
VT-LEM10021SW-H2
100mm
F2.1
800-1700nm
VT-LEM20040SW-H1
200mm
F4-22
900-1700nm
VT-LEM30040SW-H1
300mm
F4-22
400-1700nm
VT-LEM40056SW-H1
400mm
F5.6
900-1700nm

 

 

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