BTL-H1 Series 1" C-Mount Bi-Telecentric Lenses for Component Measurement
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BTL-H1 Series 1" C-Mount Bi-Telecentric Lenses for Component Measurement - [WD]73mm [FOV]26Φmm [Mag.]0.638x está agotado y se enviará tan pronto como vuelva a estar disponible.
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Don’t Order Before Reading This
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Delivery & Shipping
Delivery & Shipping
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- All orders are processed within 1 business day.
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- In-stock items: Ready for quick shipment.
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FAQ
FAQ
BTL-H1 Series 1" C-Mount Bi-Telecentric Lenses for Component M...
BTL-H1 Series 1" C-Mount Bi-Telecentric Lenses for Component Measurement - [WD]73mm [FOV]26Φmm [Mag.]0.638x está agotado y se enviará tan pronto como vuelva a estar disponible.
Product Description
The BTL-H1 Series Telecentric Lenses are high-performance optical solutions designed for large-format machine vision and precision metrology applications. Engineered for 1" (Φ16.6 mm) sensors, this series delivers ultra-low distortion, stable magnification, and high-resolution imaging across a wide range of working distances from 73 mm to 465 mm.
With magnification options from 0.638× down to 0.055×, the BTL-H1 series supports both medium and ultra-large field-of-view inspection systems. Its advanced telecentric design ensures extremely low distortion (<0.1%) and high telecentricity performance, making it ideal for high-accuracy dimensional measurement and industrial inspection.
Designed for demanding environments, the BTL-H1 series achieves excellent resolution performance (MTF30 up to 145 lp/mm) and supports long working distances for large-scale inspection setups. The robust C-Mount mechanical structure ensures easy integration into automated production lines and high-end machine vision systems.
Key Features
- Supports 1" (Φ16.6 mm) large-format sensors
- Ultra-wide magnification range: 0.055× – 0.638×
- Working distance range: 73 mm – 465 mm
- Ultra-low distortion: <0.1%
- High resolution performance: MTF30 up to 145 lp/mm
- High telecentricity for precision measurement
- Long working distance options for large FOV systems
- Robust industrial C-Mount design
- Suitable for high-end automation and metrology systems
Main Applications
- Semiconductor wafer inspection
- Precision dimensional measurement
- LCD / OLED panel inspection
- PCB and electronics inspection
- Large-scale industrial metrology
- Automated optical inspection (AOI)
- Battery and energy component inspection
- High-accuracy machine vision systems
Specifications
| Model No. | FOV | Mag. | WD (mm) | MTF30 (lp/mm) |
|---|---|---|---|---|
| BTL-0.638X-73-H1 | Φ26mm | 0.638x | 73±1 | >90 |
| BTL-0.46X-110-H1 | Φ36mm | 0.46x | 110±2 | >100 |
| BTL-0.395X-118-H1 | Φ42mm | 0.395x | 118±3 | >130 |
| BTL-0.346X-128-H1 | Φ48mm | 0.346x | 128±3 | >130 |
| BTL-0.346X-138-H1 (LM) | Φ48mm | 0.346x | 138±3 | >90 |
| BTL-0.296X-138-H1 (LM) | Φ56mm | 0.296x | 138±3 | >130 |
| BTL-0.259X-158-H1 (LM) | Φ64mm | 0.259x | 158±3 | >130 |
| BTL-0.231X-178-H1 (LM) | Φ72mm | 0.231x | 178±3 | >135 |
| BTL-0.208X-228-H1 (LM) | Φ80mm | 0.208x | 228±4 | >135 |
| BTL-0.184X-208-H1 (LM) | Φ90mm | 0.184x | 208±3 | >135 |
| BTL-0.166X-238-H1 (LM) | Φ100mm | 0.166x | 238±4 | >140 |
| BTL-0.151X-263-H1 (LM) | Φ110mm | 0.151x | 263±4 | >140 |
| BTL-0.138X-273-H1 (LM) | Φ120mm | 0.138x | 273±5 | >140 |
| BTL-0.122X-288-H1 (LM) | Φ136mm | 0.122x | 288±5 | >140 |
| BTL-0.111X-300-H1 (LM) | Φ150mm | 0.111x | 300±5 | >145 |
| BTL-0.098X-318-H1 (LM) | Φ170mm | 0.098x | 318±5 | >140 |
| BTL-0.087X-330-H1 (LM) | Φ190mm | 0.087x | 330±5 | >140 |
| BTL-0.077X-372-H1 (LM) | Φ216mm | 0.077x | 372±5 | >140 |
| BTL-0.069XH-410-H1 (LM) | Φ240mm | 0.069x | 410±6 | >140 |
| BTL-0.064X-338-H1 (LM) | Φ258mm | 0.064x | 338±5 | >140 |
| BTL-0.055X-465-H1 (LM) | Φ300mm | 0.055x | 465±6 | >135 |
Note 1：The back focal length of model with (LM) is adjustable.
Note 2：Warm tips: The above DOF is just theoretical value at the ideal aperture (eg. ±763@F11). Actual DOF or the DOF what you need, please check with our sales engineer before order cfm.
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