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Vision Datum  |  SKU: TLSW-0.5XD-H1.1

TLSW-H1.1 SWIR Telemerkezli Lens Serisi | 1.1" InGaAs Sensörler için 950–1800nm

Regular price $6,600.00
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FAQ

Q: What sensors are the TLSW Series lenses designed for?
A: The TLSW Series is optimized for 1.1" InGaAs sensors, including the Sony IMX990, providing high-performance SWIR imaging from 950–1800 nm.

Q: What spectral range do these lenses support?
A: The lenses are specially designed for 950–1800 nm SWIR transmission, enabling imaging beyond the visible spectrum.

Q: What magnification options are available?
A: The series offers 0.5×, 0.7×, 1×, 2×, and 4× magnifications to meet different field-of-view and precision measurement requirements.

Q: Are both coaxial and non-coaxial versions available?
A: Yes. The 1× and 2× models are available in both coaxial and non-coaxial configurations for flexible illumination setups.

Q: Can the depth of field be adjusted?
A: Yes. The 1× and 2× models feature adjustable iris control, allowing users to optimize depth of field for specific applications.

Q: What applications are these SWIR telecentric lenses suitable for?
A: They are ideal for semiconductor inspection, wafer analysis, solar cell inspection, precision metrology, material identification, and scientific imaging.

Q: Why use SWIR telecentric lenses instead of visible-light optics?
A: SWIR telecentric lenses can reveal material differences and defects invisible to visible-light systems, while maintaining low distortion and high measurement accuracy.

Ürün Açıklaması

TLSW Serisi SWIR Telemerkezli Objektifler, Sony IMX990 dahil olmak üzere 1.1" InGaAs sensörleri için optimize edilmiştir ve 950–1800 nm spektral aralığında yüksek hassasiyetli görüntüleme sağlar. 0.5×, 0.7×, 1×, 2× ve 4× büyütme oranlarında mevcut olan bu objektifler, görünür ışık sistemleri tarafından algılanamayan malzeme farklılıklarını ve kusurları ortaya çıkarır.

Makine vizyonu ve hassas metroloji için tasarlanan TLSW Serisi, ultra düşük distorsiyon, yüksek çözünürlük ve hem koaksial hem de koaksial olmayan yapılandırmalar sunar. 1× ve 2× modelleri, esnek netlik derinliği optimizasyonu için ayarlanabilir iris kontrolüne sahiptir. SWIR kameraları ve C-Mount sistemleriyle uyumlu olan bu objektifler, yarı iletken muayenesi, wafer analizi, güneş hücresi muayenesi ve bilimsel görüntüleme uygulamaları için idealdir.

Ana Özellikler

  • Sony IMX990 ve 1.1" InGaAs sensörleri için optimize edilmiştir
  • 950–1800 nm aralığında SWIR iletimi
  • 0.5×'ten 4×'e kadar büyütme oranları
  • Ultra düşük distorsiyon ve yüksek çözünürlük
  • Koaksial ve koaksial olmayan versiyonlar mevcuttur
  • 1× ve 2× modellerinde ayarlanabilir iris
  • Kolay entegrasyon için C-Mount arayüzü
  • Hassas ölçüm ve SWIR muayenesi için uygundur

Ana Uygulamalar

  • Yarı iletken ve wafer muayenesi
  • Güneş hücresi ve fotovoltaik analiz
  • Hassas metroloji
  • Elektronik muayenesi
  • Malzeme tanımlama
  • SWIR makine vizyonu
  • Bilimsel görüntüleme ve araştırma

Teknik Özellikler

1.1" C-Mount 950-1800nm SWIR Telemerkezli Objektif

Model Koaksial Büyütme WD F/# DOF
TLSW-0.5XD-H1.1 Evet 0.5× 116.4mm 6.3 2.02mm
TLSW-0.7XD-H1.1 Evet 0.7× 116.0mm 6.4 1.05mm
TLSW-1.0XD-H1.1 Evet 1.0× 110.0mm 7.0 0.56mm
TLSW-1.0X-H1.1 Hayır 1.0× 110.0mm 7.0 0.56mm
TLSW-2.0XD-H1.1 Evet 2.0× 110.2mm 11.5 0.23mm
TLSW-2.0X-H1.1 Hayır 2.0× 110.2mm 11.5 0.23mm
TLSW-4.0XD-H1.1 Evet 4.0× 110.3mm 20.0 0.10mm

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