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Vision Datum  |  SKU: iBX-SWG991A

640×512 257.8fps GigE Vision SWIR Camera 400–1700nm | Sony IMX991 with Cooling iBX-SWG991A/J

定価 $9,175.00
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FAQ

Q: What is the spectral range of IMX991?
A: The Sony IMX991 sensor offers a spectral response range of 400nm to 1700nm, covering both the visible and short-wave infrared (SWIR) spectrum. This wide range enables imaging applications such as semiconductor inspection, silicon wafer analysis, spectroscopy, material sorting, and machine vision.

Q: Which sensor does this camera use?
A: This camera is equipped with the Sony IMX991 InGaAs sensor, featuring a resolution of 640 × 512 pixels and a 5μm pixel size. The sensor delivers high sensitivity, low noise performance, and excellent image quality across the 400–1700nm wavelength range.

Q: Can SWIR cameras see through silicon?
A: Yes. SWIR cameras can image through silicon because silicon becomes increasingly transparent at wavelengths above approximately 1100nm. This capability allows SWIR cameras to reveal internal structures, defects, and packaging features that are not visible with standard visible-light cameras, making them ideal for semiconductor inspection and failure analysis.

Q: What is a SWIR camera used for?
A: SWIR cameras are used in a wide range of industrial and scientific applications, including semiconductor inspection, machine vision, spectroscopy, solar cell inspection, laser beam analysis, defense imaging, agricultural monitoring, and quality control. Their ability to capture information beyond the visible spectrum makes them valuable for detecting features that conventional cameras cannot see.

Q: Why use TEC cooling in a SWIR camera?
A: TEC (Thermoelectric Cooling) helps reduce sensor noise and improve image stability by maintaining a controlled detector temperature. This is especially beneficial for long exposure imaging, low-light environments, and precision measurement applications where image quality and consistency are critical.

Q: How do I integrate a SWIR camera into a machine vision system?
A: SWIR cameras can be integrated into machine vision systems through standard industrial interfaces such as USB3.0 or GigE Vision. They can be connected to industrial PCs, image processing software, frame grabbers, and automation platforms. Depending on the application, the camera can be combined with SWIR lenses, illumination sources, and machine vision software for inspection, measurement, and process monitoring tasks.

Q: What is the difference between USB3.0 and GigE SWIR cameras?
A: USB3.0 SWIR cameras provide high-speed data transfer and low latency, making them ideal for laboratory, R&D, and local image acquisition. GigE SWIR cameras support longer cable distances, multi-camera systems, and industrial network integration, making them well suited for factory automation and machine vision applications.

Q: What industries commonly use Sony IMX991 SWIR cameras?
A: Sony IMX991 SWIR cameras are widely used in semiconductor inspection, machine vision, scientific research, solar cell testing, electronics manufacturing, and defense applications. Their 400–1700nm spectral sensitivity enables imaging beyond the visible spectrum for advanced inspection and analysis tasks.

Product Description

iBX-SWG991A/J GigE SWIR Camera with Sony IMX991 Sensor

The iBX-SWG991A/J GigE SWIR Camera is a high-performance short-wave infrared imaging solution designed for industrial automation, semiconductor inspection, scientific research, and long-distance machine vision systems.

Built around the Sony IMX991 InGaAs sensor, this camera delivers reliable SWIR imaging across a 400–1700nm spectral range, with a resolution of 640 × 512 pixels and a stable frame rate of up to 257.8fps.

Unlike USB3.0 models, this GigE Vision SWIR camera is optimized for long-distance transmission, multi-camera synchronization, and industrial network integration, making it ideal for distributed inspection systems and factory automation environments.

To ensure stable operation in demanding conditions, the camera supports both:

  • TEC Cooling (Thermoelectric Cooling) for low-noise precision imaging
  • External Cooling System Option for high-temperature or continuous operation environments

Key Features

  • Sony IMX991 InGaAs SWIR Sensor
  • 400–1700nm Spectral Response Range
  • 640 × 512 Resolution
  • Up to 257.8fps Frame Rate
  • 5μm Pixel Size
  • GigE Vision Interface (Industrial Network Ready)
  • TEC Cooling / External Cooling Options
  • Low Noise, High Stability Imaging
  • Designed for Multi-Camera Industrial Systems

Applications

  • Semiconductor Wafer Inspection
  • Industrial Machine Vision Systems
  • Factory Automation & Inline Quality Control
  • Scientific & Laboratory Imaging
  • Laser Beam & Optical Analysis
  • Solar Cell Inspection
  • Defense & Surveillance Imaging

Specifications

Model iBX-SWG991A/J
Sensor Sony IMX991
Sensor Type InGaAs SWIR Sensor
Resolution 640 × 512
Sensor Size 1/4"
Pixel Size 5μm × 5μm
Spectral Range 400nm–1700nm
Frame Rate 257.8fps
Interface GigE
Cooling Mode TEC Cooling / External Cooling
Imaging Type SWIR (Short-Wave Infrared)
Application Industrial, Scientific, Semiconductor, Defense

 

GigE vs USB3.0 Difference

Compared to USB3.0 SWIR cameras, the GigE version offers:

  • Longer cable transmission distance
  • Better suitability for industrial networks
  • Easier integration into distributed systems
  • More stable multi-camera synchronization

USB3.0 models focus more on high-speed local acquisition, while GigE models are optimized for factory-scale deployment and system integration.

Sony IMX991 SWIR camera inspecting semiconductor wafers for defect detection and quality control

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