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Vision Datum  |  SKU: iBX-SWG991A

640×512 257.8fps GigE Vision SWIR Camera 400–1700nm | Sony IMX991 with Cooling iBX-SWG991A/J

$9,175.00
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FAQ

Q: What is the spectral range of IMX991?
A: The Sony IMX991 sensor offers a spectral response range of 400nm to 1700nm, covering both the visible and short-wave infrared (SWIR) spectrum. This wide range enables imaging applications such as semiconductor inspection, silicon wafer analysis, spectroscopy, material sorting, and machine vision.

Q: Which sensor does this camera use?
A: This camera is equipped with the Sony IMX991 InGaAs sensor, featuring a resolution of 640 × 512 pixels and a 5μm pixel size. The sensor delivers high sensitivity, low noise performance, and excellent image quality across the 400–1700nm wavelength range.

Q: Can SWIR cameras see through silicon?
A: Yes. SWIR cameras can image through silicon because silicon becomes increasingly transparent at wavelengths above approximately 1100nm. This capability allows SWIR cameras to reveal internal structures, defects, and packaging features that are not visible with standard visible-light cameras, making them ideal for semiconductor inspection and failure analysis.

Q: What is a SWIR camera used for?
A: SWIR cameras are used in a wide range of industrial and scientific applications, including semiconductor inspection, machine vision, spectroscopy, solar cell inspection, laser beam analysis, defense imaging, agricultural monitoring, and quality control. Their ability to capture information beyond the visible spectrum makes them valuable for detecting features that conventional cameras cannot see.

Q: Why use TEC cooling in a SWIR camera?
A: TEC (Thermoelectric Cooling) helps reduce sensor noise and improve image stability by maintaining a controlled detector temperature. This is especially beneficial for long exposure imaging, low-light environments, and precision measurement applications where image quality and consistency are critical.

Q: How do I integrate a SWIR camera into a machine vision system?
A: SWIR cameras can be integrated into machine vision systems through standard industrial interfaces such as USB3.0 or GigE Vision. They can be connected to industrial PCs, image processing software, frame grabbers, and automation platforms. Depending on the application, the camera can be combined with SWIR lenses, illumination sources, and machine vision software for inspection, measurement, and process monitoring tasks.

Q: What is the difference between USB3.0 and GigE SWIR cameras?
A: USB3.0 SWIR cameras provide high-speed data transfer and low latency, making them ideal for laboratory, R&D, and local image acquisition. GigE SWIR cameras support longer cable distances, multi-camera systems, and industrial network integration, making them well suited for factory automation and machine vision applications.

Q: What industries commonly use Sony IMX991 SWIR cameras?
A: Sony IMX991 SWIR cameras are widely used in semiconductor inspection, machine vision, scientific research, solar cell testing, electronics manufacturing, and defense applications. Their 400–1700nm spectral sensitivity enables imaging beyond the visible spectrum for advanced inspection and analysis tasks.

Descrizione del prodotto

iBX-SWG991A/J GigE SWIR Camera con sensore Sony IMX991

La iBX-SWG991A/J GigE SWIR Camera è una soluzione di imaging a infrarossi a onde corte ad alte prestazioni progettata per l'automazione industriale, l'ispezione dei semiconduttori, la ricerca scientifica e i sistemi di visione macchina a lunga distanza.

Basata sul sensore InGaAs Sony IMX991, questa fotocamera offre un imaging SWIR affidabile in un intervallo spettrale di 400–1700nm, con una risoluzione di 640 × 512 pixel e un frame rate stabile fino a 257.8fps.

A differenza dei modelli USB3.0, questa GigE Vision SWIR camera è ottimizzata per la trasmissione a lunga distanza, la sincronizzazione multi-camera e l'integrazione di rete industriale, rendendola ideale per sistemi di ispezione distribuiti e ambienti di automazione di fabbrica.

Per garantire un funzionamento stabile in condizioni impegnative, la fotocamera supporta entrambe le modalità:

  • Raffreddamento TEC (Raffreddamento termo-elettrico) per imaging di precisione a basso rumore
  • Raffreddamento Esterno Opzione di sistema per ambienti ad alta temperatura o per operazioni continue

Caratteristiche principali

  • Sensore SWIR InGaAs Sony IMX991
  • Intervallo di risposta spettrale 400–1700nm
  • Risoluzione 640 × 512
  • Frame rate fino a 257.8fps
  • Dimensione pixel 5μm
  • Interfaccia GigE Vision (Pronta per rete industriale)
  • Opzioni di Raffreddamento TEC / Raffreddamento Esterno
  • Imaging a basso rumore, alta stabilità
  • Progettata per sistemi industriali multi-camera

Applicazioni

  • Ispezione di wafer di semiconduttori
  • Sistemi di visione macchina industriale
  • Automazione di fabbrica & Controllo qualità in linea
  • Scientifico & Imaging di laboratorio
  • Fascio laser & Analisi ottica
  • Ispezione di celle solari
  • Difesa & Imaging di sorveglianza

Specifiche

Modello iBX-SWG991A/J
Sensore Sony IMX991
Tipo di sensore Sensore SWIR InGaAs
Risoluzione 640 × 512
Dimensione sensore 1/4"
Dimensione pixel 5μm × 5μm
Intervallo spettrale 400nm–1700nm
Frame rate 257.8fps
Interfaccia GigE
Modalità di raffreddamento Raffreddamento TEC / Raffreddamento Esterno
Tipo di imaging SWIR (Infrarossi a onde corte)
Applicazione Industriale, Scientifico, Semiconduttori, Difesa

 

GigE vs USB3.0 Differenza

Rispetto alle SWIR cameras USB3.0, la versione GigE offre:

  • Maggiore distanza di trasmissione del cavo
  • Migliore idoneità per le reti industriali
  • Integrazione più semplice nei sistemi distribuiti
  • Sincronizzazione multi-camera più stabile

I modelli USB3.0 si concentrano di più sull'acquisizione locale ad alta velocità, mentre i modelli GigE sono ottimizzati per il deployment su scala di fabbrica e l'integrazione di sistema.

Sony IMX991 SWIR camera inspecting semiconductor wafers for defect detection and quality control

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