400–1200 nm Visible-SWIR Telecentric Lens | Focus Shift Correction TLVS-H1.1
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400–1200 nm Visible-SWIR Telecentric Lens | Focus Shift Correction TLVS-H1.1 - 0.7x WD: 110mm / Coaxial ist auf Lager und wird versandt, sobald es wieder verfügbar ist
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400–1200 nm Visible-SWIR Telecentric Lens | Focus Shift Correction ...
400–1200 nm Visible-SWIR Telecentric Lens | Focus Shift Correction TLVS-H1.1 - 0.7x WD: 110mm / Coaxial ist auf Lager und wird versandt, sobald es wieder verfügbar ist
Product Description
The Visible-SWIR Telecentric Lens Series is designed for high-precision imaging across a broad spectral range from 400–1200 nm, enabling seamless imaging from visible light to SWIR without refocusing. Featuring advanced focus shift correction, these lenses maintain sharp images across wavelengths, making them ideal for applications requiring both visible and near-infrared imaging.
Available in 0.7×, 1×, 2×, and 4× magnifications, the series supports image circles up to Φ24 mm and offers both coaxial and non-coaxial illumination configurations. By eliminating focal shifts between visible and SWIR wavelengths, these telecentric lenses reveal material differences and defects that are difficult or impossible to detect with visible light alone.
Designed for machine vision, semiconductor inspection, solar cell analysis, and scientific imaging, the Visible-SWIR Telecentric Lens Series provides reliable, distortion-free imaging for demanding industrial applications.
Key Features
- Broad spectral range: 400–1200 nm
- Focus shift correction from visible to SWIR
- No refocusing required between visible and SWIR imaging
- Magnification options: 0.7×, 1×, 2×, 4×
- Image circle up to Φ24 mm
- Coaxial and non-coaxial illumination versions available
- High-contrast, low-distortion telecentric optics
- Suitable for industrial and scientific imaging
Main Applications
- Semiconductor inspection
- Solar cell and wafer inspection
- Material identification
- Display and glass inspection
- PCB and electronics inspection
- Precision measurement and metrology
- Scientific and laboratory imaging
- Defect detection beyond visible wavelengths
Specifications
| Model | Mag. | WD | Image Circle | Coaxial |
|---|---|---|---|---|
| TLVS-0.7XD-H1.1 | 0.7X | 110 mm | Φ20.5 mm | Yes |
| TLVS-0.7X-H1.1 | 0.7X | 110 mm | Φ20.5 mm | No |
| TLVS-1.0XD-H1.1 | 1.0X | 110 mm | Φ24 mm | Yes |
| TLVS-1.0X-H1.1 | 1.0X | 110 mm | Φ24 mm | No |
| TLVS-2.0XD-H1.1 | 2.0X | 110 mm | Φ24 mm | Yes |
| TLVS-2.0X-H1.1 | 2.0X | 110 mm | Φ24 mm | No |
| TLVS-4.0XD-H1.1 | 4.0X | 110 mm | Φ20.5 mm | Yes |
| TLVS-4.0X-H1.1 | 4.0X | 110 mm | Φ20.5 mm | No |
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